Topspin is a novel scanning and beam precession experiment framework for your Analytical Scanning Transmission Electron Microscope.

Topspin is the result of a strategic partnership combining innovative application development by AppFive and advanced tools for electron diffraction from NanoMEGAS.

Press Release – May 2, 2013

Watch the Topspin video

Tradeshow Schedule

ICFMSA13 June 3-7
Micro Society of Canada     June 18-21
55th Elec Mat Conf June 26-28
M&M 2013 booth 935 Aug 4-8
IMRC 2013 Aug 11-15
12th CIASEM Sep 24-28
Congress SBMM Oct
NCEM Users Meeting Nov 4-5
EMMM 2013 Nov 10-14
2013 MRS Fall Exhibit Dec 3-5