Instrument Control
AppFive has interfaced to many different types of microscopes (SEM, TEM, STEM, AFM) and we have done everything from acquiring images to controlling virtually everything that you would adjust manually in everyday operation.
Essential to the ability to automate an instrument is the ability to control the instrument through software. We have worked with all of the major electron microscope manufacturers, including JEOL, Hitachi, FEI/Philips and Zeiss/LEO, to be able to interface to their equipment. With the proper instrument interface, we have created advanced instrument functionality including:
- Automated instrument calibration: magnification, camera length, stage translate and tilt, spectrometer energy calibration
- Automated microscope alignment/adjustment: focus, stigmation, eucentric height adjustment
- Instrument compensation: stage drift, image drift, stage tilt shift, energy drift