Enhanced EDX & EELS
Spectroscopy PATENT PENDING

Precession assisted EELS & EDX to overcome channeling

EELS & EDX signal enhancement via beam precession experiments

Click here for proof of concept outlined by S. Estradé, et al., EELS signal enhancement by means of beam precession in the TEM, Ultramicroscopy (2012)

Click here for a press release about University of Barcelona, NanoMEGAS and AppFive partnership

Requires presence of an EELS and/or EDX spectrometer

EELS quantification possible via Topspin model-based EELS Quantification

OEM customization (EDX and/or EELS Spectrometer integration, CCD and TEM interfacing) available upon request

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We kindly acknowledge Dr. F. Peiro, S. Estrade, L. Yiedra and J. Portillo – Univ of Barcelona (Spain) Download PDF