High resolution, high speed EBSD-like data from your TEM
Ultra-fast precession electron diffraction scanned acquisition
High resolution automated phase and orientation mapping via ASTAR analysis software developed by Dr. Edgar Rauch from SIMAP-INP Grenoble-France
Texture analysis & grain size morphology studies
Spatial resolution < 2 nm attainable (FEG TEM)
Intuitive workflow
DOWNLOAD APPLICATION NOTES (PDF)
Brunetti et al Chemistry of Materials 23 (2011) 4545-24 Download PDF
Ganesh et al Nanotechnology 23 (2012) 135702 Download PDF